Espectrômetro de emissão por plasma série iCAP 6300
iCAP 6300 Performance Simplified Optimized for the routine
The requirement for "routine analysis" often results in systems variously
described as rugged and reliable, simple to use by less experienced operators
and complying with various regulatory authorities. It can mean systems of
limited flexibility, unable to effectively cope with shifts in analysis needs or
regulatory changes. Utilizing the latest design techniques and innovative new
technologies, the world’s most compact ICP system is not only ideal for routine
use but also able to expand its capabilities as circumstances dictate.
Ergonomic Instrument Design Designed with the user in mind, large
sample compartment with open access makes set up and adjustments simple.
Simplified Set Up A wide range of optimized sample introduction
kits ensures the best results with all sample types.
Enhanced Stability The integrated structural cast design and
precision regulated optics ensure excellent long term stability.
Reduced Startup Time Highly efficient distributed purge and
compact high performance optical system greatly reduce gas consumption and
initial startup time.
The ability to handle any sample type The iCAP 6300 uses a new,
highly efficient and high power solid state generator. With a wide range of
sample introduction kits available, the instrument has the power to analyze any
Choose the optimum plasma view Because different applications
require a different approach to get the best results, the iCAP 6300 is available
with either a dedicated radial or duo plasma source. Choose the radial view for
optimum performance and minimum interference with difficult samples such as
metals or used oils. Alternatively, the Duo offers the flexibility of axial view
for lowest detection limits and radial view for reduced interference; ideal for
No compromise optical design Although compact in size the iCAP
6300 has a high performance optical system on the inside. The design has been
optimized to offer excellent resolution over the entire spectrum from 166nm to
847nm enabling access to all wavelengths and minimizing spectral interference.
The analysis of trace contaminants in complex matrices is now routine.